N7950A Keysight / Agilent
DC Power Supplies
Continuously source and sink current for power storage test applications 0-9 V 100 A and 1000 W, LAN, USB, GP-IB remote control.
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Specifications : N7950A Keysight / Agilent
Dynamic Power Supply :
Choose the APS series corresponding to your required voltage and current :
- N7950A 9 V, 100 A, 1 KW, N7970A 200 A, 2 KW,
- N7951A 20 V, 50 A, 1 KW, N7971A 100 A, 2 KW,
- N7952A 40 V, 25 A, 1 KW, N7972A 50 A, 2 KW,
- N7953A 60 V, 16.7 A, 1 KW, N7973A 33 A, 2 KW,
- N7954A 80 V, 12.5 A, 1 KW, N7974A 25 A, 2 KW,
- N7976A 120 V, 16.7 A, 2 kW,
- N7977A 160 V, 12.5 A, 2 kW.
Model N7950A 0-9 V 100 A and 1000 W :
- 16-bit programming speeds, 18-bit voltage & current measurement,
- Fast rise and fall rates,
- Fast command processing,
- Low noise,
- Excellent voltage & current regulation,
- LAN, USB, GP-IB remote control.
Download the technical documentation N7950A Keysight / Agilent
With Advanced Power System (APS) 1 kW and 2 kW system power supplies, you get a new level of power supply performance.
The Advanced Power System (APS) family was designed with VersaPo er architecture to help you overcome your toughest power test challenges by delivering industry-leading specifications and innovative features in an integrated solution for today’s advanced ATE power testing needs.
Building a continuous source and load : You need a continuous source and load solution for testing power storage DUTs.
Generating power transients : In harsh real-world environments, DUTs can face power transients, such as surges and interrupts. To ensure proper operation of a design in the real world, these transients need to be simulated in testing.
Characterizing inrush current: You need to capture the large current surge that occurs when you fi rst turn on power to your DUT with reactive elements at the input.
Maintaining output integrity under dynamic load conditions: Maintaining a stable output voltage free of oscillations and voltage droop can be a challenge under a very dynamic load, especially when working with long cable runs.
Tracking power events for root-cause analysis: You want to track power events during root-cause analysis testing to see why or if you’re DUT was damaged during test.
