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E5080B-240 Keysight / Agilent

Network Analysers < 6Ghz

ENA Vector Network Analyzer 9 KHz to 4,5 GHz.

RENTAL 1 250  /week*
SALE
Brand New Price Warranty 36 month 42 500 

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Specifications : E5080B-240 Keysight / Agilent

ENA Vector Network Analyzer 9 KHz to 4,5 GHz :

  • Output Power 10 dBm,
  • 2-port test set,
  • 140 dB dynamic range,
  • 0,0015 dB rms trace noise,
  • 14 Kg weight,
  • Four SuperSpeed USB ports, Two Gigabit Ethernet, RJ-45 LAN ports, GP-IB (option).

Available options E5080B-240 Keysight / Agilent

CAL Standard Calibration 950 
172 GP-IB interface 1 470 
1E5 High stability timebase 1 850 

Download the technical documentation E5080B-240 Keysight / Agilent

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E5080B ENA Series Vector Network Analyzer

As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution.

The E5080B brings R&D performance up to 53 GHz and flexibility to a midrange platform. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability. Test consistently across your entire workflow with the same UI and SCPI commands as high-end PNAs.

The E5080B enables complete device characterization for passive components, amplifiers, mixers, and frequency converters.

You can perform more tests with one box with integrated features such as DC sources, bias tees, pulse generators, pulse modulators, and internal second source2.

Gain deeper insights with software applications including spectrum analysis, mixer measurements, and noise figure.

Choose from a 2- or 4-port option with frequency coverage from 9 kHz up to 20 GHz or for higher frequencies, 100 kHz up to 53 GHz.

The E5080B utilizes the same measurement science as other Keysight vector network analyzers (VNAs) such as the PNA, PXI, and USB VNA.

A common software platform makes it easy to choose the right level of performance to match budget and measurement needs. This commonality guarantees measurement consistency, repeatability, and a common remote-programming interface across multiple instruments in R&D and manufacturing.